Advanced VLSI design and testability issues (Record no. 14794)
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000 -LEADER | |
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fixed length control field | 04149cam a2200505Ki 4500 |
001 - CONTROL NUMBER | |
control field | 9781003083436 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | FlBoTFG |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20220724194207.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
fixed length control field | m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr |n||||||||| |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 200807s2020 flu ob 000 0 eng d |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | OCoLC-P |
Language of cataloging | eng |
Transcribing agency | OCoLC-P |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781000168174 |
Qualifying information | (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 1000168174 |
Qualifying information | (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781003083436 |
Qualifying information | (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 1003083439 |
Qualifying information | (electronic bk.) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781000168150 |
Qualifying information | (electronic bk. : PDF) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 1000168158 |
Qualifying information | (electronic bk. : PDF) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781000168167 |
Qualifying information | (electronic bk. : Mobipocket) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 1000168166 |
Qualifying information | (electronic bk. : Mobipocket) |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 0367492822 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780367492823 |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (OCoLC)1182513108 |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (OCoLC-P)1182513108 |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | TK7874.75 |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | TEC |
Subject category code subdivision | 007000 |
Source | bisacsh |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | TEC |
Subject category code subdivision | 008010 |
Source | bisacsh |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | TEC |
Subject category code subdivision | 064000 |
Source | bisacsh |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | TJFC |
Source | bicssc |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.395 |
Edition number | 23 |
245 00 - TITLE STATEMENT | |
Title | Advanced VLSI design and testability issues |
Medium | [electronic resource] / |
Statement of responsibility, etc. | edited by Suman Lata Tripathi, Sobhit Saxena, and Sushanta Kumar Mohapatra. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
Place of publication, distribution, etc. | Boca Raton, FL : |
Name of publisher, distributor, etc. | CRC Press, |
Date of publication, distribution, etc. | 2020. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 online resource. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | This bookfacilitates the VLSI-interestedindividuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, includingimage processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2-5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10-13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14-18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC's structure and function, which makes it much more difficult to reverse engineer. |
588 ## - SOURCE OF DESCRIPTION NOTE | |
Source of description note | OCLC-licensed vendor bibliographic record. |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | TECHNOLOGY / Electricity |
Source of heading or term | bisacsh |
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | TECHNOLOGY / Electronics / Circuits / General |
Source of heading or term | bisacsh |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Integrated circuits |
General subdivision | Very large scale integration |
-- | Design and construction. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Tripathi, Suman Lata. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Saxena, Sobhit. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Mohapatra, Sushanta Kumar. |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Materials specified | Read Online |
Uniform Resource Identifier | <a href="https://www.taylorfrancis.com/books/9781003083436">https://www.taylorfrancis.com/books/9781003083436</a> |
856 42 - ELECTRONIC LOCATION AND ACCESS | |
Materials specified | OCLC metadata license agreement |
Uniform Resource Identifier | <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a> |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Source of classification or shelving scheme | Library of Congress Classification |
Koha item type | eBook |
No items available.