Radiation sensors with 3D electrodes / (Record no. 14339)

MARC details
000 -LEADER
fixed length control field 06464cam a2200661Ii 4500
001 - CONTROL NUMBER
control field 9780429055324
003 - CONTROL NUMBER IDENTIFIER
control field FlBoTFG
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220724194143.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu---unuuu
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 190207s2019 flua ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency OCoLC-P
Language of cataloging eng
Description conventions rda
-- pn
Transcribing agency OCoLC-P
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780429621598
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0429621590
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780429619441
Qualifying information (ePub ebook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0429619448
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780429617294
Qualifying information (Mobipocket ebook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0429617291
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780429055324
Qualifying information (ebook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0429055323
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781498782234
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 149878223X
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1201/9780429055324
Source of number or code doi
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)1084727372
Canceled/invalid control number (OCoLC)1084318065
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC-P)1084727372
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QD117.R3
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Subject category code subdivision 057000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code SCI
Subject category code subdivision 055000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 064000
Source bisacsh
072 #7 - SUBJECT CATEGORY CODE
Subject category code PHP
Source bicssc
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 539.77
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Viá, Cinzia da,
Relator term author.
245 10 - TITLE STATEMENT
Title Radiation sensors with 3D electrodes /
Statement of responsibility, etc. Cinzia Da Viá, Gian-Franco Dalla Betta, Sherwood Parker.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Boca Raton :
Name of producer, publisher, distributor, manufacturer CRC Press,
Date of production, publication, distribution, manufacture, or copyright notice 2019.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (1 volume) :
Other physical details illustrations (black and white).
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
490 1# - SERIES STATEMENT
Series statement Series in sensors
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Cover; Half Title; Series Page; Title Page; Copyright Page; Dedication; Contents; About the Authors; Acknowledgments; Chapter 1: Introduction; Chapter 2: Silicon Radiation Sensors; 2.1. INTRODUCTION; 2.2. INTERACTION OF RADIATION WITH SILICON; 2.2.1. Charged Particles; 2.2.2. Photons; 2.2.2.1. Photon Energy Close to the Energy Gap; 2.2.2.2. Photon Energy Much Higher Than the Energy Gap; 2.2.3. Neutrons; 2.3. SEMICONDUCTOR PHYSICS; 2.3.1. Silicon as a Detector Material; 2.3.2. The p-n Junction in Reverse Bias; 2.4. POSITION-SENSITIVE SENSORS; 2.4.1. Pad (Diode); 2.4.2. Strip Sensors
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 2.4.3. Pixel Sensors2.4.4. Drift Detector; 2.5. SIGNAL FORMATION; 2.5.1. Charge Motion; 2.5.2. Induced Signals; 2.6. READOUT ELECTRONICS AND NOISE; 2.6.1. Energy Resolution; 2.6.2. Electronic Noise; Chapter 3: Radiation Effects in Silicon Sensors; 3.1. INTRODUCTION; 3.2. RADIATION DAMAGE IN SILICON; 3.2.1. Surface Damage; 3.2.2. Bulk Damage; 3.3. CAN RADIATION DAMAGE BE CONTROLLED?; 3.3.1. Surface Damage; 3.3.2. Bulk Damage; Chapter 4: 3D Sensors; 4.1. BASIC CONCEPT; 4.2. DEVICE SIMULATIONS; 4.3. EXPERIMENTAL RESULTS; 4.4. ALTERNATIVE 3D DESIGNS; 4.4.1. Single-Type-Column 3D Detectors
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 4.4.2. Double-Sided Double-Type-Column 3D detectors4.4.3. Trenched Electrodes; 4.4.4. The Pixelated Vertical Drift Detector; 4.4.5. Dual Readout in 3D Sensors; 4.5. ACTIVE AND SLIM EDGES IN 3D SENSORS; Chapter 5: Fabrication Technologies; 5.1. GENERAL ASPECTS OF SILICON DETECTOR PROCESSING; 5.1.1. Materials; 5.1.2. Technological Aspects; 5.1.2.1. Passivation Oxide Deposition; 5.1.2.2. Silicon Nitride and Polysilicon Deposition; 5.1.2.3. Junction Fabrication; 5.1.2.4. Etching and Metallization; 5.1.2.5. Gettering; 5.2. DEEP ETCHING TECHNIQUES; 5.2.1. Deep Reactive Ion Etching
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 5.2.2. Other Etching Techniques5.3. FULL 3D DETECTORS WITH ACTIVE EDGE; 5.4. ALTERNATIVE APPROACHES; 5.5. RECENT DEVELOPMENTS; Chapter 6: Radiation Hardness in 3D Sensors; 6.1. INTRODUCTION; 6.2. SOME HISTORY: INITIAL IRRADIATION TESTS; 6.3. DEVICES WITH A DIFFERENT ELECTRODE CONFIGURATION; 6.4. RADIATION HARDNESS OF 3D-STC (OR SEMI-3D) DETECTORS (FBK, VTT); 6.5. RADIATION HARDNESS OF 3D-DDTC DETECTORS (FBK, CNM); Chapter 7: The Industrialization Phase; 7.1. INTRODUCTION; 7.2. DESIGN SPECIFICATIONS AND COMMON WAFER LAYOUT; 7.3. SENSOR ELECTRICAL SPECIFICATIONS
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note 7.4. PROTOTYPE FABRICATION AND IBL SENSOR PRODUCTION STRATEGY7.5. EXPERIMENTAL RESULTS; 7.6. LESSONS LEARNED; Chapter 8: Planar Active-Edge Sensors; 8.1. INTRODUCTION; 8.2. DIFFERENT APPROACHES TO EDGELESS SENSORS; 8.2.1. Early Attempts; 8.2.2. The Scribe-Cleave-Passivate Technique; 8.3. ACTIVE-EDGE TECHNOLOGIES; 8.4. RESULTS; 8.5. ALTERNATIVE SOLUTIONS FOR SLIM EDGES; Chapter 9: Applications; 9.1. HIGH-ENERGY PHYSICS; 9.2. 3D SPEED PROPERTIES; 9.3. MEDICAL IMAGING; 9.4. PROTEIN CRYSTALLOGRAPHY AND MICRODOSIMETRY; 9.5. NEUTRON DETECTORS
520 ## - SUMMARY, ETC.
Summary, etc. Written by the leading names in this field, this book introduces the technical properties, design and fabrication details, measurement results, and applications of three-dimensional silicon radiation sensors. Such devices are currently used in the ATLAS experiment at the European Centre for Particle Physics (CERN) for particle tracking in high energy physics. These sensors are the radiation hardest devices ever fabricated and have applications in ground-breaking research in neutron detection, medical dosimetry and space technologies and more. Chapters explore the essential features of silicon particle detectors, interactions of radiation with matter, radiation damage effects, and micro-fabrication, in addition to a providing historical overview of the field. This book will be a key reference for students and researchers working with sensor technologies. Features: The first book dedicated to this unique and growing subject area, which is also widely applicable in high-energy physics, medical physics, space science and beyond Authored by Sherwood Parker, the inventor of the concept of 3D detectors; Cinzia Da Viaa, who has brought 3DSi technology to application; and Gian-Franco Dalla Betta, a leading figure in the design and fabrication technology of these devices Explains to non-experts the essential features of silicon particle detectors, interactions of radiation with matter, radiation damage effects, and micro-fabrication
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note OCLC-licensed vendor bibliographic record.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Radiation
General subdivision Measurement
-- Instruments.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Nuclear counters.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electrodes.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Silicon diodes.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element SCIENCE / Physics / Quantum Theory
Source of heading or term bisacsh
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element SCIENCE / Physics
Source of heading or term bisacsh
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Betta, G. F.
Fuller form of name (Gian-Franco Dalla),
Relator term author.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Parker, Sherwood,
Relator term author.
856 40 - ELECTRONIC LOCATION AND ACCESS
Materials specified Read Online
Uniform Resource Identifier <a href="https://www.taylorfrancis.com/books/9780429055324">https://www.taylorfrancis.com/books/9780429055324</a>
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified OCLC metadata license agreement
Uniform Resource Identifier <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Koha item type eBook

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